Structural and Dielectric Studies of Ni Doped TiO2 Thin Films for Electro-Optic Devices. London Journal of Research In Science: Natural and Formal, [S. l.], v. 23, n. 9, p. 25–32, 2023. Disponível em: https://journalspress.uk/index.php/LJRS/article/view/485. Acesso em: 2 feb. 2026.